velxio/test
David Montero 8249c9ebeb test_intel: phase B — Z80 ISA polish (CB / DAA / RLD / ADC HL / CPI)
Brings the Z80 from 8080-superset baseline toward ZEXDOC compliance:
- CB prefix: full 256 ops (BIT/SET/RES + RLC/RRC/RL/RR/SLA/SRA/SLL/
  SRL) on r ∈ B/C/D/E/H/L/(HL)/A.
- DDCB / FDCB indexed bit ops with displacement-before-opcode order.
  Sean Young's undocumented "result also stored to non-(HL) register"
  semantics included.
- Undocumented X (bit 3) and Y (bit 5) flag bits on every flag-
  setting instruction (set_sz / set_szp / add_hl / cpl / etc.).
- Z80-specific DAA via N flag direction (Sean Young §4.7 algorithm —
  the canonical ZEXALL-passing form).
- CPI / CPD / CPIR / CPDR with X/Y from (A − (HL) − H) per
  Sean Young §4.2.
- RLD / RRD 12-bit nibble rotates between A and (HL).
- 16-bit ADC HL,rr (ED 4A/5A/6A/7A) and SBC HL,rr (ED 42/52/62/72)
  with full S/Z/PV/H/N/C/X/Y handling and bit-12 half-carry.

Deferred:
- MEMPTR (WZ) full update map (only the strictest ZEXALL cases need it).
- Block I/O instructions' deterministic flags (Phase F polish).
- ZEXDOC ROM integration test (Phase F).

Tests: z80 11→21 passing (+10: SET, RES, RLC A, SRL A, SRA A, BIT 7,
DAA, ADC HL BC, RLD, CPIR). Total test_intel: 64→73 passing, 0 failed.

Master plan doc updated: phase B marked done; phase C starting.

Co-Authored-By: Claude Opus 4.7 (1M context) <noreply@anthropic.com>
2026-04-30 04:44:27 +02:00
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autosearch Add ESP32 chip demos and comprehensive tests for I2C, SPI, and UART interactions 2026-04-28 19:24:39 -03:00
backend Implement TCP and UDP NAT services for chip-initiated connections 2026-04-29 08:43:41 -03:00
esp32
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esp32-emulator
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multi_board
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multi_board_esp32 feat(multi-board): add wire-aware cross-board interconnect router 2026-04-25 19:47:40 -03:00
pi_arduino_serial
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test_100_days Add ESP32 chip demos and comprehensive tests for I2C, SPI, and UART interactions 2026-04-28 19:24:39 -03:00
test_Raspberry_Pi_Pico_W feat(epaper): Add SVG layouts and emulation plan for ePaper panels 2026-04-29 02:33:59 -03:00
test_chip_backend_runtime Add ESP32 chip demos and comprehensive tests for I2C, SPI, and UART interactions 2026-04-28 19:24:39 -03:00
test_circuit test: update BMP280 chip ID assertions and clarify tagName uniqueness in metadata drift test 2026-04-21 17:31:51 -03:00
test_custom_chips Add ESP32 chip demos and comprehensive tests for I2C, SPI, and UART interactions 2026-04-28 19:24:39 -03:00
test_custom_chips_boards Add ESP32 chip demos and comprehensive tests for I2C, SPI, and UART interactions 2026-04-28 19:24:39 -03:00
test_epaper feat(epaper): Add SVG layouts and emulation plan for ePaper panels 2026-04-29 02:33:59 -03:00
test_intel test_intel: phase B — Z80 ISA polish (CB / DAA / RLD / ADC HL / CPI) 2026-04-30 04:44:27 +02:00
docker-errors-2026-04-19.md docs: add Docker production error report (2026-04-19) 2026-04-19 00:37:07 +02:00